News
AFM Tip Characterizer (AFMTC)
Park Systems, a leading provider of Atomic Force Microscopy (AFM) and nano-metrology solutions, is proud to announce the launch of ...
Park Systems, a leading manufacturer of Atomic-Force Microscopy (AFM) systems, is celebrating its new status as the number one global leader in the industry. According to...
Park Systems, a leading manufacturer of atomic force microscopy (AFM) and nano metrology systems, has introduced its newest product, the Park NX-IR R300, a nanoscale infr...
Park Systems, a world-leading manufacturer of Atomic Force Microscopes announced Park NX-Mask, the most effective, safe, and efficient new generation photomask repair equ...
Dr. Sang-il Park, CEO of Park Systems, addresses the welcome greetings
Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems, expands its busines...
29
Sep 2022'
Press-Release
XE7 and XE15
The long-lasting Park Systems products, XE7 and XE15, will be discontinued for production effective September 30, 2022.
These two XE products will be r...
7
Sep 2022'
Press-Release
Park Systems, a world-leading supplier of Atomic Force Microscopes announced the opening of their new Eastern Regional Lab at Northeastern University's 14-acre Innovation...
2
Sep 2022'
Press-Release
Imaging Spectroscopic Ellipsometry and Active Vibration Isolation Add to Park’s Nanometrology Business Portfolio.
Park Systems Corp. today announced that it has ...
26
Apr 2022'
Press-Release
The NanoScientific Symposium 2022, an international event that brings together researchers and entrepreneurs in the fields of nanoscience and nanotechnology, will begin a...
23
Feb 2022'
Press-Release
Fraunhofer Institute for Integrated Systems and Device Technology IISB and Park Systems invite you to attend the International SPM Symposium on Failure Analysis and Mater...