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Park Systems Magazine - NanoScientific

NanoScientific Magazine, Park Systems Special Edition

NanoScientific Magazine, Park Systems Special Edition
    • Welcome
    • Nanomechanical Properties of Lipid Vesicles Using Atomic Force Microscopy
    • Designing a New Class of Atomic Force Microscope –Park FX40 The Automatic AFM
    • Quantitative frictional properties measurement using atomic force microscopy
    • The Nexus between Nanotechnology and Society 5.0
    • Evaluation of Local Mechanical and Chemical Properties via AFM as a Tool for Understanding the Formation Mechanism of Pulsed UV LaserNanoinduced Patterns
    • Simultaneous Acquisition Of Current and Lateral Force Signals
    • Let There Be Light!

NanoScientific Magazine, Summer 2021

NanoScientific Magazine 2021 Summer
    • Park Systems Announces Park FX40 the Autonomous AFM with Built-in Intelligence – A Groundbreaking New Class of Atomic Force Microscope
    • Park Systems, Global Leader in Atomic Force Microscopy, Appoints Dr. Stefan Kaemmer as President, Park Systems Americas
    • 2D Moiré Superlattice Electromechanical Characterization with Piezoresponse Force Microscopy
    • An Interview with Dr. Alan A. Tennant Lead of the Quantum Materials Initiative at Oak Ridge National Laboratory
    • Defect Recognition on Coating Layer using PinPoint Nanomechanical Mode, Atomic Force Microscopyt
    • Applying Sample Strain in-situ – A Multimodal Nanoscale Analysis including scanning probe microscopy
    • New degrees of freedom in AFM: Combining AFM with Nanofluidics
    • Comprehensive biomaterial characterization by AFM and fluorescence
    • Nanoscale Electrochemistry Study using SECCM Option of Park Systems
    • Park AFM Scholar Recipient - Chao Wen
    • In the News: Park Stock Increase

NanoScientific Magazine, Winter 2021

NanoScientific Magazine 2021 Winter
    • Magnetic Nanoscavengers: The New Trend to Improve Water Qualit
    • Contact AFM Nanolithography Based on Anodic Oxidation
    • High resolution imaging of single PTFE molecules on Teflon surface
    • Application-specific characterizations and analyses of carbon-based materials utilizing different microscopic technologies
    • Improved Electrical Characterization of Advanced Materials in High Vacuum Environment
    • Quantifying Epitaxial Growth using a Purely Topographical Signal
    • A Comparative Study of Atomic Force Microscopy between AM-KPFM and Sideband KPFM

NanoScientific Magazine, Summer 2020

NanoScientific Magazine 2020 Summer
    • Chemical Imaging is Leading to Better Molecular Information from the Micro to Nanoscale
    • Characterization of roughness and mechanical properties of a contact lens surface using atomic force microscopy (AFM) with a specialized liquid cell
    • The Interaction Between Light, Molecules, and Nanomaterials to Develop Sensors for Biomedical and other Applications Used to Combat Covid 19
    • Park SmartLithoTM – A Novel Approach for Nanopatterning Using AFM Lithography
    • Park SmartScan and AutoScript: Improving Operational Throughput and User Productivity
    • Nanoscience in GeoScience – Nanopore Characterization Using Atomic Force Microscope
    • “Materials Matter” Column 5 - 4D Printing

NanoScientific Magazine, Spring 2020

NanoScientific Magazine 2020 Spring
    • How Covid-19 Diagnostic Tests Work
    • Electrochemical AFM (EC-AFM): In Situ Monitor of Copper Deposition/Dissolution on Gold
    • Nano Infrared (IR) Photo-induced Force Microscopy (PiFM):
    • Industry News: Park Systems Completes Equity Investment in Molecular Visa
    • Detection of Magnetization Reversal in Magnetic Patterned Array using Magnetic Force Microscopy
    • Using Atomic Force Microscopy in Medical Research
    • Phase Imaging of Polymer Deposited on Gold
    • Materials Matter - Column 4 - Flexible Nano Electronics

NanoScientific Magazine, Winter 2020

NanoScientific Magazine 2020 Winter
    • Message from Editor
    • Molecular Vibrational Based Surface Sensitive Imaging – Sum Frequency Generation (SFG) Microscopy with Compressive Sensing (CS) Technique
    • The Development of Scanning Electrochemical Cell Microscopy (SECCM)
    • High Resolution Imaging of Particles Dispersed in Polymeric Matrix by True Non-Contact™ Mode Atomic Force Microscopy
    • Atomic Force Microscope (AFM)-Based Nanomanufacturing Assisted by Vibration and Heat
    • Nanoscale Material Patterning using Atomic Force Microscopy Nano-Lithography
    • Bulk photovoltaic eff ect in ferroelectric materials
    • Park Systems Announces AFM Scholar: Dr. Fei Hui, postdoctoral fellow at Technion-Israel Institute of Technology
    • “Materials Matter” Column 3 New Surfactant Design Dr. Rigoberto Advincula

NanoScientific Magazine, Summer 2019

NanoScientific Magazine 2019 Summer
    • Message from Editor
    • A Tribute to Dr. Calvin Quate (1923-2019)
    • Dr. Ken Nakajima Tokyo Institute of Technology
    • Responsive Hydrogel Coatings From Pectin Polysaccharides Extracted From Orange Peels and Cacti
    • Advantages of High Vacuum for Electrical Scanning Probe Microscopy
    • Probing the Intersection of NanoScience and Biology
    • Nanoscale Vacuum Channel Transistor on Silicon and Silicon Carbide
    • Park Systems Atomic Force Microscope Product Display
    • Utilization of Single Particle ICP-MS Analysis for Nanoparticle Reduction in Semiconductor Fabrication
    • Feature Article: Neutrino Astrophysics
    • Park Systems Announces 2019 Park AFM Scholar
    • Application Note: Probiotic Bacteria Topography and Nanomechanical Properties Analysis Using Atomic Force Microscopy
    • “Materials Matter” Column 2 - Supramolecular Chemistry, Nanomachines, and AFM

NanoScientific Magazine, Spring 2019

NanoScientific Magazine 2019 Spring
    • Message from Editor
    • Feature Article: Electric Force Microscopy of Samples Having an Appreciable Impedance -John A. Marohn, Professor & Director of Undergraduate Studies, Department of Chemistry and Chemical Biology Member, Field of Materials Science & Engineering Cornell University
    • Application Note: Electrical and Mechanical Characterization of Li Ion Battery Electrode using PinPointTM SSRM-John Paul Pineda, Cathy Lee, Byong Kim, and Keibock Lee, Park Systems Inc.
    • Feature Article: Designing Nanostructures by Nanosphere Monolayers and Dynamic Shadowing Growth: How to combine nanosphere monolayer and shadowing growth to design different plasmonic nanostructures and how to use AFM to characterize the structures- Yiping Zhao, Distinguished Research Professor, Department of Physics and Astronomy, The University of Georgia
    • Special Feature: NanoTechnology and the Environment: How the Implications of Nano Particles are Studied at the Center for Environment Implications of NanoTechnology-an Interview with Mark Wisner, Director, Center for Environment Implications of NanoTechnology
    • Article: Particle Research using AFM at Virginia Tech’s Nano Earth Lab- Weinan Leng, Virginia Tech Sustainable Nano Technology Lab Manager & Research Scientist in Civil and Environmental Engineering
    • Application Note: Mechanical properties of live and fixed cells measured by atomic force microscopy and scanning ion conductance microscopy-Jake Kim, Moses Lee and Cathy Lee Park Systems Corp
    • NanoScientific Symposiums Announced- Call For Papers
    • NanoScientific Breakthroughs
    • “Materials Matter” - Nanostructured polymer brushes with AFM

NanoScientific Magazine, Winter 2019

NanoScientific Magazine 2019 Winter
    • Message from Editor
    • Feature Article: Dr. Alberto Salleo Associate Professor, Department of Materials Science and Engineering Geballe Laboratory for Advanced Materials Stanford University, Principal Editor, MRS Communications, “Polymer based Semiconductors”
    • Feature Article: Room temperature magnetism in a flat land - Transition metal dichalcogenide Dr. Gwo-Ching Wang, Department of Physics, Applied Physics and Astronomy Rensselaer Polytechnic Institute
    • Application Note: Tooth Whitening Study using PinPoint Nanomechanical Mode of Park AFM - Alvin Lee, John Paul Pineda, Byong Kim, Park Systems Inc.
    • Application Note: Enhanced Surface Potential Detection Study using FM-SKPM - John Paul Pineda, Byong Kim, Park Systems Inc.
    • Feature Article: International Linear Collider An Interview with Dr. Lyn Evans
    • Announcement: Park AFM Scholarship 2019
    • Park AFM Scholars, Q4 2018: Liang He / Akshay Gowda
    • In the News: Park Opens New Office in Beijing, China
    • Improving Wafer Production Quality Assurance with Atomic Force Microscopy

NanoScientific Magazine, FALL 2018

NanoScientific Magazine 2018 Fall
    • Message from Editor
    • NanoScientific Symposiums: Registration Open for NanoScientific Symposium on SPM at SUNY Polytechnic Institute & NanoScientific Symposium on SPM Europe
    • Feature Article: “Insights into Submicron-Scales - Nanobubbles and Their Effect on AFM Measurements and Engineering Processes” Lisa Ditscherlein, Technical University Freiberg
    • Application Note: Differentiating Material Compositions using Lateral Force Microscopy
    • Feature Article: Tobias Cramer, Asst. Professor, Department of Physics and Astronomy, Bologna, Italy “An In Depth Look at Implantable Organic Nano Electronics”
    • Application Note: Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)
    • Feature Interview: Dr. Elliott D. Bloom- Professor of Particle Physics and Astrophysics, Emeritus Stanford- “High Energy Searches for Dark Matter using the Large Area Telescope on the Fermi Gamma-ray space observatory at Stanford”

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