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CaMnO3 thermal_conductivity Bmp Adhesion Magnetic Praseodymium H-BN PolymerPatterns Gong kelvin probe force microscopy small_scan CntFilm Phosphide Polyurethane 2dMaterials Fet Neodymium ElectroDeposition FM_KPFM OxideLayer Pvdf graphene_hybrid INSP StrontiuTitanate CNT Electrical&Electronics Polyvinylidene_fluoride 2d_materials AdhesionForce ThermalProperties Mechanical ContactMode TyphimuriumBiofilm LeakageCurrent AM-KPFM
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V