-
TCS SICM non_contact Bacterium Au111 ForceMapping Bismuth Roughness BCZT PetruPoni Cross-section Electronics Array Protein CeNSE_IISc BismuthVanadate Optic Perovskite KevlarFiber Polyimide CuSubstrate Filter Cobalt-dopedIronOxide lithography Praseodymium Ecoli LifeScience PinpointPFM TempControl Iron ScanningIon-ConductanceMicroscopy ScanningSpreadingResistanceMicroscopy tip_bias_mode OpticalWaveguide phase_change