| Contact Us   Global

Workshops

At Park Systems we offer live demos to better show the capabilities and functions of our equipment. Found below is a list of the upcoming demos we are hosting along with links to register for each event.
For further information, click on ‘Details’ for the demo you are interested in. 

  • Register (Individual)
  • Register (Group)

 Join us for free beer and a live demo to explore the nanoscale world of Moiré patterns!

150518-Beer-and-Demo-Moire-Patterns

Event Date 05-29-2015
Event End Date 05-29-2015
Cut off date 03-03-2024
Individual Price Free
  • Register (Individual)
  • Register (Group)

Join us for free beer and a live demo to learn about some of the new breakthroughs at Park Systems

Automatic Defect Review (ADR):
High throughput ADR for 300 mm blank wafers with Park atomic force microscopy (AFM)

Event Date 02-24-2015
Event End Date 02-24-2015
Cut off date 03-03-2024
Individual Price Free
  • Register (Individual)
  • Register (Group)

Park SmartScan: The revolutionary way to image with AFM with a click of a button

smartscan-buttons

Event Date 12-09-2014
Event End Date 12-09-2014
Cut off date 03-03-2024
Individual Price Free
  • Register (Individual)
  • Register (Group)

Surface Roughness Measurement with AFM: Using non-contact mode imaging for angstrom level roughness measurement

140925-critical-roughness-metrology

Event Date 09-25-2014
Event End Date 09-25-2014
Cut off date 03-03-2024
Individual Price Free
  • Register (Individual)
  • Register (Group)

High Quality Liquid AFM Imaging: Size and Elasticity Measurements in Nanoparticle Samples

140822-PHA

Event Date 08-22-2014
Event End Date 08-22-2014
Cut off date 03-03-2024
Individual Price Free