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Workshops

At Park Systems we offer live demos to better show the capabilities and functions of our equipment. Found below is a list of the upcoming demos we are hosting along with links to register for each event.
For further information, click on ‘Details’ for the demo you are interested in. 

Beer and Demo - Automatic Defect Review

Join us for free beer and a live demo to learn about some of the new breakthroughs at Park Systems

Automatic Defect Review (ADR):
High throughput ADR for 300 mm blank wafers with Park atomic force microscopy (AFM)

Event Date 02-24-2015
Event End Date 02-24-2015
Cut off date 06-10-2023
Individual Price Free

Park SmartScan

Park SmartScan: The revolutionary way to image with AFM with a click of a button

smartscan-buttons

Event Date 12-09-2014
Event End Date 12-09-2014
Cut off date 06-10-2023
Individual Price Free

Surface Roughness Measurement with AFM

Surface Roughness Measurement with AFM: Using non-contact mode imaging for angstrom level roughness measurement

140925-critical-roughness-metrology

Event Date 09-25-2014
Event End Date 09-25-2014
Cut off date 06-10-2023
Individual Price Free

High Quality Liquid AFM Imaging

High Quality Liquid AFM Imaging: Size and Elasticity Measurements in Nanoparticle Samples

140822-PHA

Event Date 08-22-2014
Event End Date 08-22-2014
Cut off date 06-10-2023
Individual Price Free
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