Special Mode
Park Torsional Force Microscopy
Unlocking the Secrets of Lateral Forces with Park TFM
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What is Park Torsional Force Microscopy?
Torsional Force Microscopy (TFM) is an advanced AFM technique designed to reveal lateral interactions such as nanoscale friction, atomic lattice structures, and surface anisotropies. By exciting the cantilever in torsional resonance using dual piezo actuators (180° out of phase), Park TFM captures high-resolution phase and amplitude data—providing unparalleled insight into surface mechanics that traditional vertical-only AFM modes miss.
Whether you're probing twisted 2D materials or assessing polymer blend interfaces, Park TFM enables dynamic and sensitive analysis of lateral mechanical properties at the atomic scale.
Whether you're probing twisted 2D materials or assessing polymer blend interfaces, Park TFM enables dynamic and sensitive analysis of lateral mechanical properties at the atomic scale.
Key Features
Torsional Resonance Detection
Dual lateral piezo actuators induce controlled torsional oscillations to capture true lateral force signals.
High-Resolution Frictional Imaging
TFM phase and amplitude data reveal nanoscale variations in friction and surface texture with extraordinary clarity.
Phase & Amplitude Monitoring
Extract precise dynamic friction data with high sensitivity even for delicate or anisotropic samples.
Atomic-Scale Resolution
Visualize moiré patterns and atomic lattice contrast in materials such as twisted bilayer graphene or WSe₂.
See What TFM Can Do
The atomic lattice of mica was imaged using Torsional Force Microscopy (TFM), which provides high spatial resolution and allows direct observation of frictional contrast at the atomic scale.
Why Choose Park TFM Over Conventional LFM?
While traditional lateral force microscopy struggles with resolution and cross-talk from topography, Park TFM isolates torsional interactions to provide a cleaner, more accurate assessment of frictional and lattice properties.
Conventional LFM
Excitation Mechanism
Cantilever bending
Sensitivity to Lateral Forces
Limited
Resolution of Atomic Features
Rare
Detection Stability
Prone to topographic artifacts
Park TFM
Excitation Mechanism
Dual torsional piezo actuators
Sensitivity to Lateral Forces
High (torsional resonance)
Resolution of Atomic Features
Routine (moiré, lattice)
Detection Stability
Noise-minimized phase/amplitude imaging
Applications
tBG on hBN
hBN
Mica
MoS₂
WSe₂ Atomic Lattice
What Applications Can Be Measured?
If your research demands precise mapping of friction, moiré contrast, or lattice symmetry, Park TFM is your ideal tool.
2D Materials
Polymers & Blends
Semiconductors
Thin Films & Nanostructures