TFM measures lateral forces by detecting torsional deflections of the cantilever during scanning, especially effective for probing atomic lattices and other extremely small feature surfaces.

TFM operates by exciting the torsional resonance of the cantilever using a pair of piezo actuators driven out of phase. This setup generates a pure rotational torque around the cantilever axis while minimizing unwanted vertical or flexural modes. At the same time, a closed-loop feedback maintains stable topographic tracking by controlling the normal force. The lateral deflection caused by frictional interaction is detected through the photodetector’s lateral channel and analyzed at the torsional resonance frequency. This dual control scheme ensures accurate mapping of lateral friction contrast while preserving imaging stability.

The high sensitivity of TFM to dynamic lateral forces makes it especially effective for resolving nanoscale structures that are difficult to capture using conventional methods. In contrast to standard lateral force microscopy (LFM), which can suffer from noise and mode mixing, TFM offers cleaner, higher-contrast images of moiré patterns and atomic lattice periodicity, even under ambient conditions. These capabilities are essential for studying twist-angle-dependent properties in layered 2D materials. TFM is well suited for a wide range of applications, including the characterization of twisted bilayer systems, soft materials, and insulating films. It is compatible with large-area scanning and various cantilever types. When integrated into Park Systems' automated AFM platforms, such as the FX40, TFM provides researchers with a practical and reliable method to investigate fine frictional contrasts at the nanoscale.

TFM imaging of twisted bilayer graphene (tBG) on hexagonal boron nitride (hBN) reveals distinct moiré patterns at points P1 and P2. These differences arise from local variations in twist angle and interlayer coupling, which modulate the periodicity and symmetry of the moiré superlattice. TFM’s sensitivity to lateral frictional forces allows clear differentiation of these patterns, revealing subtle variations in electronic structure and strain within the heterostructure that are critical for understanding the material's unique quantum and electronic properties.

TFM detects the torsional bending of the cantilever as it interacts with the surface, enabling high-resolution visualization of nanoscale friction patterns and lateral mechanical heterogeneity, enables to measure in-plane frictional and lateral force variations at the nanoscale. The Lateral (C-D) and TFM amplitude images show the amplitude signals, highlighting differences in surface friction or shear force responses across the scanned area. The TFM phase image displays the phase contrast, providing additional insight into material properties such as local viscoelasticity and adhesion behavior.