PinPoint
PinPoint™ Nanomechanical
High-speed, force-curve based imaging technique that enables simultaneous mapping of topography and mechanical properties at every pixel
What is PinPoint™ Nanomechanical Mode
PinPointTM Nanomechanical mode measures topography and mechanical properties such as modulus, adhesion, deformation, and energy dissipation at every pixel through high-speed force-curve acquisition, eliminating lateral forces to preserve sample integrity.
In PinPoint mode, the AFM tip approaches the sample vertically at each pixel, performs a complete force–distance interaction, and then retracts before moving laterally to the next pixel. This eliminates lateral scanning friction and allows for independent analysis of mechanical response at each location.

During each cycle, the system acquires force–separation curves and calculates nanomechanical parameters using appropriate contact models (e.g., Hertz, DMT and JKR). Because tip–sample contact is transient and highly localized, PinPoint mode is ideal for fragile, soft, or heterogenous samples such as polymers, biomaterials, and multilayers.
Reasons to Use This Mode
The PinPoint mode provides simultaneous topography and quantitative mechanical property maps, including modulus, stiffness and adhesion, through high-speed acquisition of force curves at every pixel. This multi-dimensional analysis enables researchers to understand material behavior beyond surface morphology, particularly in heterogeneous samples such as composites, biomaterials, and thin films. By integrating high-speed electronics and optimized software architecture, PinPoint mode significantly reduces imaging time compared to conventional force-distance mapping, enabling real-time extraction of modulus and adhesion for full-frame nanomechanical imaging within a practical time frame.
  • Sample: PS-PMMA
  • System: FX40
  • Scan Size: 6 μm × 6 μm
Applications and Use Cases
PinPoint mode simultaneously captures high-resolution maps of height, stiffness, modulus, and adhesion, enabling clear visualization of phase-separated PS and LDPE domains. The rigid PS regions show higher stiffness and modulus, while the softer LDPE exhibits lower mechanical values and stronger adhesion, reflecting differences in molecular structure and mobility. This multidimensional analysis is invaluable for polymer research, as it connects local nanoscale properties with bulk composite performance, guiding the engineering of advanced materials for packaging, films, and durable polymer products.
  • Sample: PS-LDPE
  • System: NX10
  • Scan Size: 10 μm × 10 μm
PinPoint mode enables the simultaneous acquisition of quantitative height, modulus (mechanical stiffness), and adhesion force, delivering a comprehensive assessment of surface morphology and nanomechanical properties in a single measurement. This frictionless, approach-retract operation eliminates lateral forces, protecting both delicate polymeric separator materials and the AFM tip from wear or damage. In the example of the lithium battery diaphragm, PinPoint mode effectively reveals nanoscale topographical features, spatial variations in mechanical modulus, and differences in adhesion force that are relevant to the performance and reliability of battery separators.
  • Sample: Lithium Battery Diaphragm (Separator)
  • System: FX40
  • Scan Size: 5 μm × 5 μm