We’re excited to be part of one of Europe’s leading gatherings for scanning probe microscopy and nanotechnology research. Join our Polish distributor Technolution Sp. z o.o. at the XIII Workshop on Applications of Scanning Probe Microscopy – STM/AFM 2025.
Whether you're exploring advanced AFM solutions or seeking new collaboration opportunities, our team is ready to connect. Visit the Technolution booth to discover how Park Systems’ cutting-edge tools and expertise can help optimize your workflows and accelerate your research.
Date: 26-30 November 2025
Location: Conference and Recreation Center "HYRNY" in Zakopane
Booth: tbc
Join our Talk!
Dr. Elena Arbelo Jorge will present the latest innovations in AFM technology and how Park Systems is enabling breakthroughs across materials science, semiconductors, and life sciences.
Title: An introduction to the newest Park Systems' atomic force microscopy solutions. Empowering innovation across nanotechnology application
Date & Time: tbc
Abstract:
Atomic Force Microscopy (AFM) is a versatile, high-resolution tool for characterising advanced nanomaterials. It offers powerful capabilities that extend far beyond topographical imaging. Its strength lies in its ability to perform correlative measurements of multiple physical properties, such as electrical conductivity, surface potential, nanomechanical stiffness and local chemical composition, all at the nanoscale.
In this presentation, we introduce the latest FX series of atomic force microscopes, which boast a high level of built-in automation features that set them apart from other research-grade atomic force microscopes on the market. Automation reduces the need for manual handling of the equipment, thereby facilitating its use. It also dramatically reduces set-up time and eliminates user error and equipment breakage.
This series is the easiest, most versatile and cutting-edge platform for investigating a range of nanometre-scale features, such as 2D materials, low-dimensional optoelectronics, biopolymers, biomaterials, nanoparticles and nanofabricated devices. Additionally, we will present examples of some of our most advanced modes, such as electrical and electrochemistry modes, and correlated AFM with IR spectroscopy.
In this talk, we present how Park Systems' AFMs are an indispensable, multifunctional platform for comprehensive nanoscale characterization across disciplines.
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