Case Snapshot

The Challenge

Needed a platform versatile yet simple enough to avoid manual setup errors across 30+ users of varying experience.

The Breakthrough

Enabled safe, sequential multi-technique workflows — including KPFM and nanolithography — even for first-time users.

The Outcome

Delivers faster, more consistent, reproducible measurements with reduced handling risk across 30+ users.

Why It Matters

Supports peer-reviewed research published in Applied Physics Letters (DOI: 10.1063/5.0335049).

Simplifying Advanced AFM Workflows in Multi-User Research Labs

ICFO streamlined multi-user AFM operation and enabled reliable advanced nanoscale characterization with Park FX40

  • ​​​​​​​​Customer: The Institute of Photonic Sciences (ICFO), Spain — Nanocharacterization Laboratory
  • Research Focus: Multi-user AFM operation across diverse research groups in a shared nanocharacterization facility supporting 30+ users
  • Solution: Park FX40 (Automated AFM Platform)
  • Key Value: Automated probe exchange, multi-technique workflows (KPFM, nanolithography), simplified multi-user operation

The Challenge

As a shared nanocharacterization facility at ICFO, the laboratory supports more than 30 users ranging from first-time students to experienced AFM researchers. Research groups working across diverse scientific disciplines require a versatile AFM platform capable of supporting multiple measurement modes while remaining intuitive, reliable, and easy to operate.

In a multi-user environment, manual probe exchange, tip detection, and laser alignment increase setup complexity and the risk of handling errors. Researchers also need the flexibility to perform multiple AFM techniques on the same sample location, making workflow efficiency, reproducibility, and ease of use critical requirements.

“The users need different modes according to their research interests, requiring a versatile tool capable of probing different surface properties, while being user friendly and delivering high quality results.”

— Dr. Federico Stramaglia, Staff Researcher, Nanocharacterization Laboratory, The Institute of Photonic Sciences (ICFO), Spain

The Solution

ICFO adopted the Park FX40 to simplify AFM operation in a highly shared, multi-user environment while maintaining advanced measurement flexibility.

  • Automated Probe Exchange: Enables seamless switching between AFM techniques while minimizing manual handling of sensitive instrument components.
  • Auto Laser Alignment & Tip Detection: Automatically detects the tip, aligns the laser, and simplifies setup, improving consistency between users.
  • User-Friendly Multi-User Operation: Simplifies advanced AFM operation for users of all experience levels while enabling safer and more consistent measurements in shared labs.
  • Image-Guided Sample Navigation: Allows users to directly locate and measure features of interest from captured sample images, accelerating positioning and workflow efficiency.

The Results

The FX40 enables safer, more consistent AFM operation in ICFO's shared nanocharacterization facility, supporting researchers and students with varying levels of experience while reducing setup complexity and instrument handling.

Advanced workflows combining multiple AFM techniques on the same sample location, including KPFM and nanolithography, can be performed more efficiently and reproducibly. Measurements conducted using the FX40 contributed to peer-reviewed research published in Applied Physics Letters.

“With the FX40 automation, this problem is completely solved. The users just need to press a button, and the instrument will automatically pick up one probe from the cassette or drop it off.”

— Dr. Federico Stramaglia

Key Outcomes

  • Advanced Multi-Technique Workflows — supports sequential measurements using different probes on the same sample location
  • Simplified Multi-User Management — helps new users learn AFM operation quickly while supporting organized handling of group-specific probes
  • Faster, Flexible Workflows — accelerates setup, sample positioning, and switching between probes and techniques
  • Safer Shared-Lab Operation — reduces the risk of accidental instrument damage
  • Publication-Ready Research Output — FX40-supported measurements contributed to peer-reviewed research in Applied Physics Letters

Related Publication​

This capability is further demonstrated through peer-reviewed research from The Institute of Photonic Sciences (ICFO), including work on graphene nanomechanical sensing of trap-assisted charge dynamics in leaky silicon oxide, published in Applied Physics Letters. (DOI: 10.1063/5.0335049)

About Park FX40

The Park FX40 is a fully automated AFM platform designed for shared, multi-user research environments. Capabilities include automated probe exchange, auto laser alignment and tip detection, and image-guided sample navigation — enabling reliable, reproducible nanoscale characterization across users of all experience levels.

Learn more: www.parksystems.com/fx40

This case study is based on an interview with Federico Stramaglia at ICFO. The FX40 helped support advanced measurement workflows while simplifying AFM operation in a multi-user research environment.