Automated Electrical Atomic Force Microscopy for Layered Materials Research / Compact Overview
SPEAKERS
  • James Kerfoot
    Park Systems UK Ltd, Nottingham, United Kingdom
Authors
James Kerfoot

This webinar provides a compact overview of how automated atomic force microscopy can support layered materials research, especially where efficient and reliable nanoscale characterization of both morphology and electrical properties are essential. We explore how the automation features of the FX200 AFM make otherwise laborious experiments easy to perform. We look at example studies of moiré patterns in graphene on hBN and twisted bilayer MoS2 using several AFM modes. We then switch to a live demonstration showing topographic mapping, AFM cleaning and moiré imaging, highlighting the applicability of Park’s FX series AFMs for both materials discovery and scale-up.