Webinar

Curved-surface thin-film coatings present unique inspection and failure-analysis challenges. Local thickness variations can lead to latent performance degradation, yet these variations are often difficult to detect using conventional planar metrology techniques.

In this webinar, we introduce Imaging Spectroscopic Ellipsometry (ISE) as a failure-analysis-oriented metrology solution for characterizing thin-film coatings on curved structures. Through case studies on microlens arrays with varying radii of curvature, we demonstrate how ISE enables spatial mapping of coating thickness and reveals gradients that are inaccessible to conventional ellipsometry.

Join us to learn how ISE supports non-destructive inspection, advanced failure analysis, and process monitoring for next-generation curved optical and semiconductor structures.