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Electrical Characterization

컨덕턴스, 샘플 저항, 기타 전기적 및 형상 특성에 대한 정확한 정보를 필요로 하는 사용자를 위해 파크시스템스는 다양한 전기 특성 모드를 갖추고 있습니다.

Electrostatic Force Microscopy (EFM)

High-resolution mapping of surface electrostatic forces and potential variations by detecting long-range interactions between AFM tip and the sample surface

Kelvin Probe Force Microscopy (KPFM)

Nanoscale imaging of surface potential and work function via electrostatic force compensation

Sideband Kelvin Probe Force Microscopy (Sideband KPFM)

Enhanced surface potential sensitivity and spatial resolution through resonance frequency detection

Heterodyne Kelvin Probe Force Microscopy (Heterodyne KPFM)

Superior surface potential detection with high spatial resolution by frequency mixing away from cantilever resonance, reducing noise and topography crosstalk

Piezoreponse Force Microscopy (PFM)

Nanoscale ferroelectric and piezoelectric domain imaging through electromechanical coupling detection
Dual Frequency Resonance Tracking-Piezoresponse Force Microscopy (DFRT-PFM)

Dual Frequency Resonance Tracking-Piezoresponse Force Microscopy (DFRT-PFM)

High-sensitivity piezoresponse imaging using dual-frequency resonance tracking for precise analysis of complex domain structures and electromechanical behavior

Conductive AFM (C-AFM)

Mapping surface topography and local electrical conductivity via current flow through the conductive AFM tip in contact with the sample

IV Spectroscopy

IV spectroscopy is measured on the selected sample area after taking a sample image

Photocurrent Mapping (PCM)

Mapping nanoscale photoconductivity and carrier dynamics under controlled light illumination

Microwave Impedance Microscopy (MIM)

Nanoscale electrical property mapping based on capacitance and conductivity changes

Scanning Capacitance Microscopy (SCM)

Nanoscale semiconductor doping and carrier profiling by detecting capacitance variations between the AFM tip and sample under AC bias

Scanning Spreading Resistance Microscopy (SSRM)

High-resolution resistivity mapping of semiconductor surfaces by measuring local current flow through a conductive AFM tip in contact mode

Scanning Tunneling Microscopy (STM)

Atomic-scale electronic surface imaging based on tunneling current detection between tip and sample