Making the connection. Atomic force microscopy correlates Graphene’s functional properties on the nanoscale Ilka M. Hermes,1 Simonas Krotkus,2 Ben Conran,3 Clifford McAleese,...

  Armando Melgarejo, Ben Schoenek, and Byong Kim Technical Services, Park Systems, Inc., USA Introduction From materials science to biological research, scientists have adopted Kelvin Probe F...

  Jiali Zhang and Byong Kim Park Systems Inc., Technical Services, Santa Clara, CA USA Introduction The Holy Grail in electrocatalysis and energy storage is to correlate electrochemical activ...

  Research Application Technology Center, Park Systems Corporation Introduction Since the development of Atomic Force Microscopy (AFM) [1], several measurement modes have been developed to cha...

  John Paul Pineda, Charles Kim, and Byong Kim Park Systems, Inc., Santa Clara, CA USA Introduction Sophisticated, high-performing technology often requires electrical components with advance...

  Armando Melgarejo, Ben Schoenek, Jiali Zhang, and Byong Kim Park Systems, Inc., Santa Clara, CA, USA Introduction The field of nanotechnology has diversified into different areas of researc...

Lennaert Wouters1, Albert Minj1,2, Umberto Celano1, Thomas Hantschel1, Wilfried Vandervorst1,2, Kristof Paredis1 1IMEC, Leuven, Belgium 2Department of Physics and Astronomy, University of Leuven, Le...

High Resolution Phase Imaging of Polymer Thin Film Coated on Gold (Au) John Paul Pineda, Charles Kim, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...

Nanoscale Material Patterning using Atomic Force MicroscopyNano-Lithography John Paul Pineda, Charles Kim, Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA INTROD...

Stabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization via dual frequency resonance tracking Ilka Hermes1, Romain Stomp2 1Park Systems Europe, Mannheim...