John Paul Pineda, Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA    Introduction Lithium ion batteries (LIBs) are key components of modern electronics and ...

Jonathan Ludwig1,2, Marco Mascaro1,2, Umberto Celano1, Wilfried Vandervorst1,2, Kristof Paredis1 1. IMEC, Leuven, Belgium 2. Department of Physics and Astronomy, University of Leuven, Leuven, Belgiu...

Moses Lee, Jake Kim and Cathy Lee Park Systems Corporation, Suwon, Korea    Introduction Surface treatment is a critical component in a variety of fields and industries such as automobil...

Jake Kim, Moses Lee and Cathy Lee Park Systems Corp., Suwon, Korea     Abstract During the process of cell sample preservation, cell fixation plays an essential role for a wide range o...

Enhanced Surface Potential Detection Study using FM-KPFM John Paul Pineda, Charles Kim,Cathy Lee, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction Scanning Kel...

Tooth Whitening Study using PinPoint Nanomechanical Mode of Park AFM Alvin Lee, John Paul Pineda, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Introduction In recent ye...

“PARK ATOMIC FORCE MICROSCOPY (AFM) PLAYS AN IMPORTANT ROLE IN OUR 3-D PRINTING PROJECTS IN THE LABORATORY. THIS POWERFUL TOOL IS CAPABLE OF LOOKING AT THE SURFACE PROFILE OF 3-D PRINTED OBJECTS CRE...

PinPoint Piezoelectric Force Microscopy Wenqing Shi, Cathy Lee, Gerald Pascual, John Paul Pineda, Byong Kim, Keibock Lee Park Systems Inc., Santa Clara, CA USA ABSTRACT Electromechanical coupling...

Electrical Conductivity Measurement of Carbon Nanotubes Film using Conductive Probe Atomic Force Microscopy (C-AFM) John Paul Pineda, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems Inc., S...

Using AFM PinPoint™ Nanomechanical Mode for Quantification of Elastic Modulus in Materials Two Orders of Magnitude Faster than Force Volume Spectroscopy John Paul Pineda, Gerald Pascual, Byong Ki...