Exploring ferroelectricity in layered materials using electrostatic force microscopy in vacuum
J. Kerfoot1*, V. V. Korolkov1 1 Park Systems UK Ltd, MediCity Nottingham, D6 Thane Rd, Nottingham, UK, NG90 6BH * 이 이메일 주소가 스팸봇으로부터 보호됩니다. 확인하려면 자...
Study of dental implant using Atomic force microscopy
Introduction The occurrence of tooth loss can be related to population ageing and accidents associated with road traffic, workplace, or sport activities. It is not only a cosmetic issue but also oral...
Investigation of lipid bilayer formation by AFM
Introduction Cell membranes are highly complex structures in which a variety of cellular activities occur in response to both specific and non-specific extracellular signals [1,2]. Extracellular sign...
Nano-pipette based scanning probe microscopy
Introduction Since atomic force microscopy (AFM) has been developed1, various applications of nanotechnology were established that led to technological advances in many fields of science. Using decou...
Capturing conductive ferroelectric domain walls
Ilka Hermes and Andrea Cerreta1 1 Park Systems Europe, Germany Introduction: Ferroelectric materials typically feature wide band gaps and are therefore classified as insulators. They carry a sp...
Characterization of roughness and mechanical properties of a contact lens surface using atomic force microscopy (AFM) wi...
Research Application Technology Center Abstract A soft contact lens is mostly used type of contact lens which is made of gel-type material. This slippery and transparent material with a unique curva...
Correlating the electrochemical response of 2D materials to their thickness
Marc Brunet Cabréa, Aislan Esmeraldo Paivaa, Matej Velickýb, c, d, Paula E. Colavitaa, Kim McKelveya, e a Trinity College Dublin (Ireland) b University of Manchester (United Kingdom) c Cornell ...
Surface potential measurements of 2D materials in high vacuum
J. Serron, A.Minj, L. Wouters, T. Hantschel IMEC, Leuven, Belgium Introduction: With the scaling of conventional field effect transistors (FETs), it becomes increasingly important to ov...
MFM on Mn1.4PtSn: Investigating magnetic hosts for Anti-Skyrmions
B. E. Zuniga Cespedes1,2, A. S. Sukhanov1,3, P. Milde1, L. M. Eng1,4, I. Hermes5, A. Klasen5 1 Institute of Applied Physics, Technische Universität Dresden, D-01062 Dresden, Germany 2 Max Planck In...
Quantitative frictional properties measurement using atomic force microscopy
Research Application Technology Center, Park Systems Corp. Introduction Atomic force microscopy (AFM) is a powerful tool that can be used to obtain information on surface morphology of t...
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