AFM methodologies for quality assessment of lithium-ion battery electrodes
Introduction Lithium ion-based batteries (LIBs) are the state-of-the-art portable energy storage to power our daily life. Ever progressing advances in both miniaturization and storage capacities made...
Electrical Characterization using Scanning Microwave Impedance Microscopy
Armando Melgarejo1, Nicholas Antoniou2 1 Park Systems, Inc. 2 PrimeNano, Inc. Introduction Understanding the electrical properties of materials is a growing concern in materials research and the ...
Introducing EC-AFM; Experimental setup and applications
Research Application Technology Center Introduction Electrochemistry is an essential study of industries such as batteries, fuel cells, semiconductors, etc. and, more broadly, can be adopted a wide...
Characterizing the displacement and voltage induced on a piezo/photodiode device by pulsed laser excitation via time res...
Andrea Cerreta1, Zeinab Eftekhari2, Rebecca Saive2, Alexander Klasen1 1Park Systems Europe, Germany 2Inorganic Materials Science, MESA+, University of Twente, Enschede, 7522NB, the Netherlands Int...
Single molecule interactions analysis using force-distance spectroscopy with functionalized tips
Research Application Technology Center Introduction A molecular recognition process refers to the specific binding event between two molecular pair such as receptor-ligand, protein-protein, and prot...
Moiré imaging with conductive atomic force microscopy
J. Kerfoot1*, V. V. Korolkov1 1Park Systems UK Ltd, MediCity Nottingham, D6 Thane Rd, Nottingham, UK, NG90 6BH *pse@parksystems.com Introduction Conductive AFM (C-AFM) is a technique capable of a...
Biological recognition by force-distance spectroscopy, AFM
Research Application Technology Center Introduction Biological recognition is a fundamental process in biological systems that describes various phenomena that revolve around the characteristics of ...
Technical note for NX-Mask (Novel approach for photomask repair by using AFM)
Application Technology Center Introduction The photomask is a key component in photolithography for nano-patterning wafers in semiconductor device manufacturing. A photomask selectively transmits or...
Effortless AFM data analysis with Park SmartAnalysis
Research Application Technology Center With the successful launch of SmartScanTM, we at Park Systems developed an AFM operating software that set new standards for nanoscale measurement, productivity...
Electrostatic artifacts in magnetic force microscopy measurement
Introduction Over the past decades, Atomic force microscopy (AFM) has been intensively involved in nanoscale research and development. Despite being widely used, understanding AFM data is sometimes c...
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