언제 어디서나 파크시스템스의 AFM 기술을 체험해 보세요. 별도의 장비나 대기 시간 없이 실제 측정 환경과 결과를 시뮬레이션으로 확인할 수 있습니다. 간편한 인터랙티브 체험을 통해 파크시스템스의 AFM 기술과 다양한 활용 가능성을 살펴보세요. *SmartSimulator는 실제 Park AFM 소프트웨어가 아닌, 파크시스템스의 나노계측 솔루션을 간소화하여 체험할 수 있도록 제작된 시뮬레이션 프로그램입니다.
Semiconductor
Polymer
Life
Metal & Ceramic
Thin Film
AFM Exclusive
Please Select Your Application
Application
Semiconductor
Polymer
Life
Metal & Ceramic
Thin Film
AFM Exclusive
Mode
Vision
Scan Config
128
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2048
4096
0.2
0.25
0.5
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Scan Area
Sample Details
- Sample:
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Region Histogram
Line Profile
Line Histogram
About SmartAnalysis
Park SmartAnalysis™ is an atomic force microscopy image processing and data analysis software for Park AFM. It is the next generation image analytics software with powerful features and newly added automated functions. Park SmartAnalysis enables users to swiftly prepare, analyze and publish their AFM acquired images and measurements.
- - Precise image analysis via multi-layer and line function: roughness statistical values, multiple specific areas of the histogram, etc.
- - Effortless image processing with EZ Flatten producing optimal images
- - High-quality 2D, 3D images, histogram, and region statistics analysis
- - Image export and publishing without degrading the image resolution
Scanned Image
Used Mode
Sample
- Head Mode:
- Scan Size:
- Scan Pixel:
Analysis Insight
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