Park Systems, a global leader in AFM technology, is recognized worldwide for its highly reliable and innovative nanoscale analysis solutions, making a significant impact on both research and industry. We are proud to announce our participation in the 32nd International Conference on Scanning Probe Microscopy (ICSPM32), held in Sapporo, Japan.
Dr. Park Sang-il, CEO of Park Systems, has been specially invited as a keynote speaker at this prestigious international conference. In his keynote presentation, titled "Unraveling the History of Atomic Force Microscopy: The Genesis and Evolution of AFM from Laboratory Instruments to Industrial Nanometrology", Dr. Park will explore the history of AFM technology and present a forward-looking vision for innovative nanoscale analysis solutions, highlighting AFM's evolution from laboratory instruments to its critical role in industrial nanometrology.
Event Details:
- Date: November 18-20, 2024
- Location: Hotel Monterey Edelhof Sapporo
- Official Program: See the full program
Don’t miss this opportunity to connect with thought leaders, gain valuable knowledge, and explore how AFM revolutionizes nanotechnology.
About ICSPM32
The International Conference on Scanning Probe Microscopy (ICSPM), sponsored by the Japan Society of Applied Physics, was first organized in 1985 to promote the development of SPM-related science and technology. Originally a domestic event, ICSPM became an international conference in 1993 and has been held annually since. The conference has grown significantly, fostering interactions between researchers, particularly from Asia and the Pacific rim. Over the years, ICSPM has hosted distinguished scientists and held joint events with related conferences, including STM and ACSIN. The conference welcomes active participation from young researchers and students, offering several awards for outstanding contributions.
For more information, visit the official website: https://dora.bk.tsukuba.ac.jp/event/ICSPM32.