The applications staff of Park Systems is proud to present a look at our PinPoint Nanomechanical Mode atomic force microscopy imaging technology using cantilever probes of various stiffness values. PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces. Join us as Dr. Wenqing Shi, Applications Scientist here at Park Systems, gives an overview of PinPoint Nanomechanical Mode, the effects of using probes with cantilevers of various stiffness values, and review nanomechanical characterization data taken from real-world samples.