Piezoresponse Force Microscopy: Techniques, Advances, and Recent Applications
SPEAKERS
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Edward Park
RE Application Technology Team, Park Systems Corporation
Edward Park is a member of the Application Technology Team in the Research Equipment Division at Park Systems. He supports the development and optimization of atomic force microscopy (AFM) applications, with a particular focus on electrical AFM modes and high-resolution nanoscale imaging.With a background in physics and research experience in scanning tunneling microscopy (STM), he applies his expertise to the technical evaluation and advancement of electrical characterization methods and small-area AFM measurements for functional materials and semiconductor devices.
- Access Speaker Publications
SPEAKERS
-
- Edward Park
- RE Application Technology Team, Park Systems Corporation
Authors
This webinar introduces the fundamentals of piezoelectricity and Piezoresponse Force Microscopy (PFM), including its operating principles. It compares conventional off-resonance PFM, contact-resonance PFM, and Dual-Frequency Resonance Tracking PFM (DFRT-PFM), highlighting their measurement principles, advantages, and applications. Through practical case studies, participants will explore how PFM reveals local piezoelectric responses, ferroelectric domain structures, domain switching behavior, and nanoscale electromechanical properties across various materials.
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