Webinar

Nanoscience and technology is one of the most potential research fields in the current fundamental sciences and high-tech. The nanoscale characterization and measurement techniques, including Electron Microscopy, Scanning Probe Microscopy (SPM) and Super-Resolution Optical Microscopy, play key roles in the developing progress of Nano-S&T. Until now, a series of SPM techniques, especially Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), have become the core research tools for the materials’ structure, properties and functions at the micro- and nano-scale. As the most extensive SPM techniques, AFM can also be in corporate with the other spectroscopy techniques to realize their nanoscale characterization capabilities in real-space.
In this three-time talk, (1) the fundamental of SPM will be brief introduced firstly, then the basic theory, instrumentation and methods of AFM will be discussed detailed; (2) the three common AFM working modes and their specific applications; (3) the functional AFM modes and their basic principles and applications in the research of materials’ properties at the micro- and nanoscale. A brief comment on the further development of AFM probe techniques and their expanding application areas are also supplied.