Introduction to Nano-IR: Principles, Modes & Practical Applications
SPEAKERS
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John Park
RE Application Technology Team, Park Systems Corporation
John Park is part of the Application Technology Team within the Research Equipment Division at Park Systems. He specializes in AFM-based characterization and application support, helping customers achieve accurate and reproducible measurement results.
Through collaboration with global research institutions and industry clients, he has been involved in various application-focused projects, providing technical consultation and customized measurement strategies. His work focuses on translating advanced AFM technology into practical research and industrial solutions.
- Access Speaker Publications
SPEAKERS
-
- John Park
- RE Application Technology Team, Park Systems Corporation
Authors
Infrared Atomic Force Microscopy (Nano-IR) integrates nanoscale topographical imaging with infrared-based chemical analysis, providing powerful insight into material properties at high spatial resolution.
This webinar offers a structured introduction to Nano-IR, beginning with the fundamental working principles behind the technique. Participants will gain a clear understanding of how infrared excitation is coupled with AFM detection to generate localized chemical information at the nanoscale.
The session will also introduce key measurement modes and discuss practical aspects of data acquisition and interpretation. Attendees will learn how different operating modes influence signal generation, spatial resolution, and data quality, as well as how to approach basic spectral and mapping analysis.
Designed for researchers and engineers who are new to Nano-IR or seeking a clearer conceptual foundation, this webinar provides essential knowledge to better understand measurement results and confidently apply Nano-IR in research and analytical workflows.
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