Optical Hybrid SPM technology Development and Park Systems Atomic Force Microscopy
Speaker : Dr. Sang-Joon Cho Affiliation : Park Systems Korea Region : India Year : 2020 Language : English Explore the integration of Optical Hybrid SPM technology, combining AFM and White Light Lnterferometry(WLI), for advanced nanoscale imaging and analysis. Discover its applications across semiconductor industry and 2D material research.
