AFM to Measure Electrostatic Force

Speaker : Dr. Ashutosh Valavade Affiliation : Park Systems, India Region : Asia Year : 2021 Language : English Explore Electrostatic Force Microscopy (EFM) in Atomic Force Microscopy (AFM), a technique for mapping electric properties of sample surfaces. Learn about principles, techniques like dual pass lift mode, and applications like Kelvin Probe Microscopy (KPM) for quantitative surface potential mapping.

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AFM Exclusive

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