Speaker : Assoc. Prof. Soon Chin Fhong Affiliation : Universiti Tun Hussein Onn Malaysia Region : Asia Year : 2022 Language : English Atomic force microscopy (AFM) is a primary technique established since 1980s’ for enabling advanced materials research. The high-resolution data has been used to facilitate discovery across broad range of fields and applications. In this topic, the non-contact mode (NCM) AFM will be introduced. NCM imaging has the advantage of avoiding sample damage while providing good tip-sample separation. Herewith, the applications of AFM for biological samples such as cells, thin film, emerging nano-material and polymers that had been tested in our research centre will be presented. Grain size measurements using the AFM XE software will be indicated. The sample preparation technique and challenges in acquiring the surface morphology of different types of samples using AFM will be shared during the session.
%20Webinar.png)
