Twisted Bilayer Graphene on hBN
A Twisted Bilayer Graphene on hBN was measured in Conductive AFM to acquire current image. The image shows the morie pattern between Twisted bilayer graphene and hexagonal boron nitride.
Scanning Conditions
- System: Park FX40
- Scan Mode: Conductive AFM (Channel: Current)
- Scan Rate: 3 Hz
- Scan Size: 100 µm × 100 µm
- Pixel Size: 256 × 256 pixels
Related Contents
System Webinars
Automated Electrical Atomic Force Microscopy for Layered Materials Research / Compact Overview
System Webinars
Introduction to Nano-IR: Principles, Modes & Practical Applications
System Webinars
Solving Thin-Film Uniformity Challenges on Curved Surfaces with Imaging Spectroscopic Ellipsometry
×