Ta/NiFe/Ta Pattern
A Ta/NiFe/Ta was measured in Magnetic Force Microscopy to acquire current image. The image shows the shape of a microman Ta/NiFe/Ta.
Scanning Conditions
- System: NX20
- Sample: Ta/NiFe/Ta Pattern
- Scan Mode: Magnetic Force Microscopy (Channel: MFM Phase)
- Scan Rate: 0.5 Hz
- Scan Size: 10 µm × 10 µm
- Pixel Size: 512 × 256 pixels
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