Aluminium TX630 alloy

Aluminium_alloy.JPG

 

An aluminium TX630 alloy was characterized using Sideband KPFM to obtain surface potential information. The scan image reveals nanoscale potential variations up to 1201 mV, appearing as tiny dots on the substrate that form an irregular pattern.

 

 

 

 

Scanning Conditions

- System: NX10
- Scan Mode: Sideband Kelvin Probe Force Microscopy (Channel: Surface Potential)
- Scan Rate: 0.2 Hz
- Scan Size: 50 µm × 50 µm
- Pixel Size: 1024 × 512 pixels
- Peak-to-valley: 1201 mV

 

 

 

Application

Related Products

Related Modes

Kelvin Probe Force Microscopy (KPFM)

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