The Frontier in Nanotechnological Solutions From Mechanical to Various SPM Analysis
Speaker : Dr. Sang Joon Cho Affiliation : Park Systems Korea Region : Japan Year : 2022 Language : English Explore the journey of Scanning Probe Microscopy (SPM) from 1985, revolutionizing semiconductor industries, defect analysis, and nanomechanical measurements. Uncover advanced techniques like automated AFM and Photo-induced Force Infrared Microscopy, addressing challenges in manufacturing, defect repair, and biodegradable polymers. Witness AFM's pivotal role, augmented by AI, in solving diverse industry issues.
