Mica
2D Materials
A mica surface was characterized using Torsional Force Microscopy (TFM). The high-resolution scan over a 5 nm area clearly resolves the atomic lattice structure, as shown in the TFM amplitude image.
Scanning Conditions
- System: NX-Hivac
- Scan Mode: Torsional Force Microscopy (TFM), (Channel: TFM Amplitude)
- Scan Rate: 5 Hz
- Scan Size: 5 nm × 5 nm
- Pixel Size: 512 × 512 pixels
×