Battery Film Diaphragm
Scanning Conditions
- System: Park FX200
- Scan Mode: PinPoint™
- Scan Rate: 0.15 Hz
- Scan Size: 5 µm × 5 µm
- Pixel Size: 256 × 256
- Cantilever: NSC36_A (k=1.0 N/m, f=90 kHz)
Related Contents
System Webinars
Advanced Methods for Research into Ferroelectric Materials and Superlattices
System Webinars
Deeper insights into 2D-Materials and related Microcrystals by Imaging Spectroscopic Ellipsometry (ISE) and Imaging Mueller Matrix Ellipsometry (IMME)
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
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