Specifications
Scanner
XY scanner range: 100 μm × 100 μm
AFM head Z scanner range: 15 μm, (optional 30 μm)
SICM head Z scanner range: 15 μm, (optional 30 μm)
Electronics
ADC: 18 channels
24-bit ADCs for X, Y, and Z scanner position sensor
DAC: 17 channels
20-bit DACs for X, Y, and Z scanner positioning
3 channels of integrated lock-in amplifier
Spring constant calibration (Thermal vibration method)
Digital Q control
AFM/SPM Modes
Basic modes: True Non-contact™ mode, Tapping mode, and Phase imaging, Contact mode and LFM, PinPoint™ imaging, F/D spectroscopy, Force volume imaging, MFM, Enhanced EFM (Basic EFM, DC-EFM, PFM and SKPM), FMM, Nanoindentation
NX option modes: C-AFM Options (Basic C-AFM, ULCA, VECA, SSRM), High Voltage option, SCM, SThM, STM
Vision (AFM)
Direct on-axis vision of sample surface and cantilever
Field-of-view: 840 μm × 630 μm (with 10× objective lens)
Camera: 5 M Pixel (default), 1 M Pixel (optional)
Objective lens
10x (N. A. 0.21) ultra-long working distance lens
20x (N. A. 0.42) high-resolution, long working distance lens
Software - Park SmartScan™
• AFM system control and data acquisition software
• Auto mode for quick setup and easy imaging
• Manual mode for advanced use and finer scan control
Software - XEI
• AFM data analysis software
• Stand-alone design—can install and analyze data away from AFM
• Capable of producing 3D renders of acquired data
Inverted Optical Microscopy
Objective lens: up to 100x
Fluorescence microscopy* (optional)
Confocal microscopy* (optional)
GloveBox (Optional)
• Allows precise control over the humidity
• Makeup of specified gaseous environments
• Allowing you to insulate highly reactive materials
Dimensions in mm
