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TipBiasMode FM-KPFM silicon_carbide Neodymium Imprint Magnetostrictive Vanadate Silicon flakes OpticalElement I-VSpectroscopy strontiu_titanate PDMS IndiumTinOxide Leakage Conduct MLCC ContactModeDots SAM Floppy StainlessSteel 3-hexylthiophene Anneal contact doped DIWafer FFM InLiquid layers Mfm Polypropylene SurfaceChange Edwin Aluminum MolybdenumDisulfide
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Co coated surface
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.7Hz
- Pixel: 512×256
- Lift height: 30nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 0.7Hz
- Pixel: 512×256
- Lift height: 30nm