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Park Systems is proud to present the 2021 Park AFM Certification Course.  Click below for information or register for our first two upcoming classes!

Join Park Systems' upcoming online lectures and explore Atomic Force Microscopy's working principles (AFM). The course will cover AFM operational principles through lectures and interactive demo sessions with live interaction from the attendees.



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1. How AFM Works by Ben Schoenek on April 22, 2021 at 10 AM - 12 PM PDT.

■ Attendees will engage in a one-hour lecture on how an AFM operates. Then spend an hour in an interactive demo session practicing contact-based imaging on a Park Systems NX series AFM.

Lecture #1: How AFM Works (Two-hour session)

· What is Atomic Force Microscopy?
We will engage in a roughly one-hour lecture exploring the finer details of how an AFM operates, the components involved in its feedback mechanism, and the atomic interaction between tip and sample. Discussion and questions are welcomed.

· Interactive Demo Session One:
Lecture topics will be reinforced through demonstration and practice of Contact based imaging on a Park Systems NX series AFM. AFM operator controls are highlighted with emphasis on linking the feedback loop to changed hardware parameters.


2. Topography Modes by Ben Schoenek on April 23, 2021 at 10 AM - 12 PM PDT.

■ Attendees will engage in a one-hour lecture on fundamental AFM operations (Contact, True Non-Contact, Tapping, and Pinpoint) used to acquire topography of nanoscale features with a Park Systems AFM. Then spend an hour in an interactive demo session practicing the different operating modes.

Lecture #2: How AFM Works (Two-hour session)

· How to Acquire Nanoscale Topography Using AFM
We will again engage in a roughly one-hour lecture applying the finer details of how an AFM operates to the fundamental operational modes (Contact, True Non-Contact™, Tapping, and PinPoint™) used to acquire topography of nanoscale features with a Park Systems AFM. Discussion and questions are welcomed.

· Interactive Demo Session Two:
Lecture topics will be reinforced through demonstration and practice of True Non-Contact™, Tapping, and PinPoint™ on a Park Systems NX series AFM. Each imaging mode and sample choice will demonstrate how the AFM is used to gain topographical information at the nanoscale and reinforce operator feedback control of the tip and sample atomic interaction.

Presenter:
Ben Schoenek is a Senior Technical Service Engineer for Park Systems, where he focuses on service and support of AFM systems for Park's research user base. He received his Master's in Physics from Auburn University, and holds a B.A. in Physics from Kenyon College.

 


3. PinPoint nanomechanical mode By Armando Melgarejo on May 25, 2021 at 10 AM - 12 PM PDT.

Lecture #3 PinPoint Nanomechanical Mode (Two-hour session)

· Why PinPoint? And how does it work?
An approximately one-hour lecture about Pinpoint will be given. The working principle and the operation models will be discussed (Hertz, JKR and DMT). Terms like Young modulus, adhesion force, Poisson ratio, etc, will be clarified. Questions are welcomed at any time during the lecture. Introductory PinPoint Video (10 min)

· Interactive Demo Session One:
Lecture topics will be reinforced through demonstration and practice of PinPoint nanomechanical imaging on a Park Systems NX series AFM. Emphasis will be put in the different Pinpoint parameters and its effect in the young modulus calculation. PS-LDPE (Polystyrene with Low-density polyethylene) film will be used as demo sample to calculate the Young modulus. Questions are welcomed at any time during the session.


4. Nanoindentation By Armando Melgarejo on June 23, 2021 at 10 AM - 12 PM PDT.

Lecture #4: Nanoindentation (Two-hour session)

· Nanomechanical characterization by Indentation.
An approximately one-hour lecture about Pinpoint will be given. The working principle and the operation models will be discussed (Hertz, JKR and DMT). Terms like Young modulus, adhesion force, Poisson ratio, etc, will be clarified. Questions are welcomed at any time during the lecture. Introductory PinPoint Video (10 min)

· Interactive Demo Session One:
Interactive session will consist of demonstrating nanoindentation process (Set point & Z height). Differences in the result analysis will be explained. Demonstration sample will be a polycarbonate film. Questions are welcomed at any time during the session.

Presenter:
Armando Melgarejo is an engineer for Park Systems, where he focuses on the installation and support of AFM systems for Park’s research user base. He holds a B.S. in Biotechnology Engineering from Autonomous University of Queretaro, Mexico. During his studies, he also spent a semester doing research in nanotechnology and molecular biology at Czech Technical University in Prague, Czech Republic. Other areas of expertise include diverse characterization techniques (AFM, SEM, RAMAN and IR), genetics and molecular and cell biology.

 

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