Mechanical property analysis by recording cantilever deflection relative to controlled tip–sample distance during approach and retraction cycles

High-speed, force-curve based imaging technique that enables simultaneous mapping of topography and mechanical properties at every pixel

High-speed quantitative nanomechanical imaging of modulus and adhesion while significantly reducing scan time over large areas

Nanoscale viscoelastic property measurement by applying oscillatory forces via the AFM cantilever and analyzing the frequency-dependent mechanical response

Lateral force mapping by detecting torsional deflections of the cantilever during scanning over the sample surface

Analyzing friction and slip behavior through mapping lateral forces across the surface

Force Amplitude and Phase Imaging of Sample Elasticity

Nanoscale mechanical characterization using controlled force application for hardness and modulus

Direct nanoscale surface modification and patterning through controlled tip–sample interactions