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AdhesionForce Domain temperature controller AFM CeramicCapacitor biocompatible molecular_self_assembly hetero_structure atomic_layer ContactModeDots Polyvinylidene_fluoride KAIST SiliconCrystal OrganicCompound PVAC FrictionalForce AEAPDES Yeditepe Topography C_AFM BiFeO3 Defects Reduction membrane EvatecAG Temperature Lift IRDetector ContactModeDot FrictionalForceMicroscopy Optic GaP Strontium Ecoli graphene_hybrid 2dMaterials
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126