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    XE7
    AFM Specifications

Park XE7 Specifications

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Z Scanner

Guided high-force flexure scanner

Scan range : 25 µm
Height noise level : 50 pm
(RMS, at 0.5 kHz bandwidth)

XY Scanner

Single module flexure XY-scanner with closed-loop control

Scan range : 50 µm × 50 µm
(optional 10 µm × 10 µm or 100 µm × 100 µm)

 

Stage

Z travel range : 29.5 mm (Motorized)
Focus travel range : 70 mm (Manual)
XY travel range : 13mm × 13 mm (Manual)

 

Sample Mount

Sample size : Open space up to 100 mm x 100 mm, thickness up to 20 mm
Sample weight : < 500g

 

Optics

Coupled with 10x (0.28 N.A.) objective lens
Direct on-axis vision of sample surface and cantilever
Field-of-view : 480 × 360 µm (with 10× objective lens)
CCD : 1 M pixel, 5 M pixel (optional)

 

Software

SmartScan

Dedicated system control and data acquisition software
Adjusting feedback parameters in real time
Script-level control through external programs (optional)

XEI

AFM data analysis software

 

Electronics

High performance DSP : 600 MHz with 4800 MIPS
Maximum 16 data images
Maximum data size : 4096 × 4096 pixels
Signal inputs : 20 channels of 16 bit ADC at 500 kHz samplings
Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
Synchronous signal : End-of-image, end-of-line, and end-of-pixel TTL signals
Active Q control (optional)
Cantilever spring constant calibration (optional)
CE Compliant
Power : 120 W
Signal Access Module (Optional)

 

AFM Modes
(*Optionally available)

Standard Imaging

True Non-Contact AFM
Basic Contact AFM
Lateral Force Microscopy (LFM)
Phase Imaging
Tapping AFM

Force Measurement

Force Distance (F/d) Spectroscopy
Force Volume Imaging

Mechanical Properties*

Force Modulation Microscopy (FMM)
Nanoindentation*
Nanolithography*
Nanolithography with High Voltage*
Nanomanipulation*

Magnetic Properties*

Magnetic Force Microscopy (MFM)
Tunable Magnetic Field MFM

 

Electrical Properties*

Conductive AFM (C-AFM)
IV Spectroscopy
Kelvin Probe Force Microscopy (KPFM)
KPFM with High Voltage
Scanning Capacitance Microscopy (SCM)
Scanning Spreading-Resistance Microscopy (SSRM)
Scanning Tunneling Microscopy (STM)
Photo Current Mapping (PCM)

 

AFM Options

Temperature Control

Temperature Controlled Stage 1
  -25 °C to +170 °C
Temperature Controlled Stage 2
  Ambient to +250 °C
Temperature Controlled Stage 3
  Ambient to +600 °C

Liquid Cells

Universal Liquid Cell
Open or closed liquid cell with liquid/gas perfusion
Temperature control range: 0 °C to +110 °C (in air), 4 °C to +70 °C (with liquid)
Electrochemistry Cell
Open Liquid Cell

Liquid Probehand

Designed for imaging in general liquid environment
Resistant to most buffer solutions including acid
Contact and Non-contact AFM imaging in liquid

Magnetic Field Generator

Applies external magnetic field parallel to sample surface
Tunable magnetic field
Range : -300 ~ 300 gauss
Composed of pure iron core & two solenoid coils

 

Dimensions in mm

xe7 dimension

Park XE7 - Specifications | Park Atomic Force Microscope