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Melt IndiumTinOxide MeltingPoint Ucl fe_nd_b Hexatriacontane SPMLabs WWafer Forevision PUR PhaseChange self_assembly AdhesionEnergy Spain Mfm Dopped WS2 Zagreb CVD Subhajjit UnivOfMaryland solar_cell EPFL phase_change HiVacuum AIN BoronNitride PS_PVAC Materials VortexCore LateralForceMicroscopy GaP BFO pinpoint mode ForceMapping
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Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V