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PinPoint Piezoelectric Force Microscopy

Thursday, May 31, 2018

  • 11:00 am – 12:00 pm
    (PDT)
    San Francisco, LA
  • 2:00 pm – 3:00 pm
    (EDT)
    Boston, New York
  • 6:00 pm – 7:00 pm
    (GMT)
    London
  • 7:00 pm – 8:00 pm
    (CET)
    Paris, Rome
PFM 1

MLCC Piezoresponse

PFM can be used to look at the electrical response from a multilayered ceramic capacitor (MLCC) sample to unambiguously identify dielectric and electrode layers. White scale bar = 2 um.

The applications staff of Park Systems is proud to present an introduction to PinPoint piezoelectric force microscopy (PFM). PFM is one type of scanning probe microscopy (SPM) technique that allows imaging and manipulation of piezoelectric and ferroelectric materials domains. 

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force. The PinPoint variant of PFM, specific to Park Systems AFMs, enables image acquisition with higher spatial resolution without any lateral force.

Join us as the Technical Marketing team at Park Systems explains the basics of PinPoint PFM and reviews its potential for investigating the electric domain structures (such as polarity) in piezoelectric and ferroelectric materials.

Wenqing

Presented by Dr. Wenqing Shi, Applications Scientist at Park Systems

Prior to joining Park Systems, Dr. Shi got her PhD in Analytical Chemistry from Indiana University under the mentorship of Prof. Lane Baker. She previously studied Chemistry at Wuhan University and received her BS in 2011.

Park Lectures - Park Atomic Force Microscope

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