| Contact Us |    Global
cantilever

The leading innovator of nanoscale
microscopy and metrology solutions

About Us
FX40-AFM

Accelerate Your Research

Park FX40
NX-Wafer-AFM

Accurion i4

The ultimate stability and accuracy
solution for your scientific research

NX20-AFM

Park NX20

Accurate Large Sample AFM solution
for research and failure analysis

NX-Mask-AFM

Park NX-Mask

Repair your most challenging
photomask defects

NX-Wafer-AFM

Park NX-Wafer

Industry's leading automated AFM
for in-line metrology solutions

Emerging Trends of Nanotechnology

Read the Park systems' Technical Articles about AFM to understand recent developments

Read more

AFM Experts provides you Online Courses, Webinar, Live Demos and Educational Videos from AFM Experts

Read more

Park Systems aims to support the next generation of Trail Blazers in Nanoscience by encouraging young researchers to share and discuss their research

Read more

park logo

2014 Schaefer & Park User Group Meeting

 We are delighted to be able to invite you to attend the Schaefer & Park User Group Meeting and Workshops on April 2, 2014 in Dresden, Germany. This meeting serves as an international forum to discuss and learn about Park’s AFM, and how it is used in various fields such as biological science, hard disk drive and semiconductor technology, failure analysis and general research. It brings together practitioners and researchers from Germany and some neighbor countries to explore and examine how Park’s equipments are used in different industries.
Date / Time Wednesday, April 2, 2014
Agenda
09:30 Get Together (Coffee)
09:45 Welcome and Overview (Martin Schaefer)
10:00 Self-Introduction of Participants
(Area of activity, how is Park AFM used, Applications, Expectations)
Break(Drinks)
11:15 Park Systems Technology Update
(Ryan Yoo) (45 min presentation)
Break(Finger foods and Drinks)
12:30 Presentation and hands-on training
Park XE - general Topography imaging
(True non-contact; Phase; Lateral Force; etc)
(Cathy Lee, Michael Kuhne)
13:30 Presentation and hands-on training
Park XE - Dielectric/Piezoelectric properties
(EFM, PFM, KPFM, etc)
(Cathy Lee, Michael Kuhne)
15:00 Presentation and hands-on training
Park XE - Electrical properties
(C-AFM; SCM; etc)
(Cathy Lee, Michael Kuhne)
16:30 Presentation and hands-on training
Park XE - Other modes and questions
(Cathy Lee, Michael Kuhne)
Venue TBA
Source Please contact info@schaefer-tec.com for information how to register

Latest Park News

View more

Explore Park Products


A New Class of Atomic Force Microscope

Park FX40

Repair your most challenging photomask defects

NX-Mask

Thin film characterization imaging ellipsometer nanofilm

Accurion EP4

Compact benchtop isolation table in 3 sizes for versatile use

Accurion EP4

Experience our product's high-quality, precise, and long life backed by our worldwide service network. We are strongly committed to maintaining the quality of our products, making us a trustworthy choice for all your repair and maintenance needs.

We await your inquiry and will arrange for you to speak with a specialist today to explore tailored solutions for your research needs. Please fill out the form now, and we will promptly get in touch with you.

Don't miss out on new product announcements, the latest tech insights, special events, and more. Subscribe now to receive regular updates straight to your inbox!

Copyright © 2024 Park Systems. All Rights Reserved.