| Contact Us   Global

Using scanning capacitance microscopy with a Park Systems atomic force microscope a team at NASA successfully characterized both the spatial variations in capacitance as well as the topography of vacuum-channel nanoelectronic transistors.

Experience our product's high-quality, precise, and long life backed by our worldwide service network. We are strongly committed to maintaining the quality of our products, making us a trustworthy choice for all your repair and maintenance needs.

We await your inquiry and will arrange for you to speak with a specialist today to explore tailored solutions for your research needs. Please fill out the form now, and we will promptly get in touch with you.

Don't miss out on new product announcements, the latest tech insights, special events, and more. Subscribe now to receive regular updates straight to your inbox!