The 8th Multifrequency AFM Conference will take place on October 27-30, 2020 in Madrid, Spain. Park Systems is delighted to announce its participation as an exhibitor!
The Multifrequency AFM conference series aims to provide the environment where the experts and the newcomers in the force microscopy and nanomechanics fields share knowledge, expertise and ideas about instrumentation, methodologies and theoretical aspects on advanced atomic force microscopy.
This year the conference will focus on such topics as high speed AFM, nanomechanics, bimodal AFM, high resolution imaging of soft matter, 3D imaging of solid-liquid interfaces, cantilever design and dynamics and multifrequency methods.
Visit our booth to discuss with us high-performance AFMs that impact science. From the exclusive PinPoint™ nanomechanical AFM mode to electrical AFM in High Vacuum, our team will be happy to discuss with you your research needs!
Besides that, join our Principal Scientist - Ilka Hermes for oral presentation on "Simultaneous vertical and lateral resonance tracking PFM on ferroelectric". Plese see the abstract below.
- Event Dates: 27 – 30 October 2020
- Venue: Colegio Oficial de Odontólogos y Estomatólogos de la Primera Región, Madrid
- Our location: Park Systems booth
Link: https://wp.icmm.csic.es/multifrequency-afm/
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Simultaneous vertical and lateral resonance tracking PFM on ferroelectric thin films
Even prior to the rise of perovskite solar cells, functional ferroelectric thin films have been investigated for their potential application in electronic and optoelectronic devices. For instance, the bulk photovoltaic effect based on ferroelectricity promises above band gap photovoltages for photovoltaics. Furthermore, conductive domain walls between ferroelectric domains could act as charge carrier pathways lowering recombination rates and, thus, increase the charge collection in electronic devices.1–3
To correlate ferroelectric effects in domains on electronic and optoelectronic properties in ferroelectric functional materials vertical and lateral domains should be visualized with a high spatial resolution. The local piezoelectric information becomes available via piezoresponse force microscopy (PFM). For thin films, the weak piezoresponse can be enhanced by driving the electrical excitation of PFM close to the vertical (deflection) or lateral (torsion) contact resonance. Since the contact resonance depends on a consistent tip-sample contact a high surface roughness often introduces topographic crosstalk.4 Dual frequency resonance tracking (DFRT) improves the stability of the resonance enhancement.5 Here, we demonstrate our capabilities to capture the out-of-plane and in-plane DFRT piezoresponse simultaneously, by driving the electrical excitation of the cantilever at the contact resonance of the vertical deflection, as well as the torsional resonance on ferroelectric thin films, including bismuth ferrite and lead zirconium titanate.
Figure 1: Frequency spectrum of cantilever in contact including the out-of-plane vertical resonance CR1 and the in-plane lateral resonance CR2. The sidebands used for the resonance tracking (A2 and A3 for the vertical resonance and A5 and A6 for the lateral resonance) are visualized in grey.
