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BiasMode LogAmplifier Au111 LDPE molecular_beam Epoxy Dimethicone Pipette Co/Cr/Pt lithography PinpointPFM Pores MolybdenumDisulfide TempControl Kevlar HexagonalBN Nanofiber Ni81Fe19 flakes self_assembly cooling CarbonNanotube Piezoresponse Alloy SSRM NtuEee SicMosfet KelvinProbeForceMicroscopy bias_mode DentalProsthesis Ananth Hafnia NUS_Physics Edwin semifluorinated_alkane
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Imprint sample
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256