Wednesday, April 29, 2020
- 9:00 am – 10:00 am
(PDT)
San Francisco, LA - 12:00 pm – 13:00 pm
(EDT)
Boston, New York - 5:00 pm – 6:00 pm
(GMT)
London - 6:00 pm – 7:00 pm
(CET)
Paris, Rome
Electrode sample using SSRM
3D-Overlay of topography and conductance images acquired from an LIB electrode sample with Pinpoint SSRM Mode using Park NX-Hivac AFM system.
The applications staff of Park Systems is proud to present an introduction to PinPoint scanning spreading resistance microscopy (SSRM). SSRM is a scanning probe microscopy (SPM) technique that allows imaging and electrical characterization of a semiconductor materials.
SSRM functions by engaging a sample’s surface with a conductive SPM probe. The current flow, produced by the applied bias voltage between the sample and the conductive probe is measured to acquire the electrical data. The PinPoint variant of SSRM, specific to Park Systems AFM, enables image acquisition of both electrical and mechanical data with higher spatial resolution without any lateral force.
This webinar session will explain the basics of PinPoint SSRM and review its potential for investigating the electrical and mechanical characteristics of lithium ion battery electrodes.
Presented By :
John Paul Pineda, Applications Engineer, Park Systems
John Paul is an engineer for Park Systems, where he focuses on the support of AFM systems for Park’s research user base. He is also responsible for researching and writing technical papers and application notes for publication and presentation at scientific conferences. Prior to joining Park Systems, he was a QA engineer in failure analysis at Toshiba Information Equipment Philippines. He received his BS in electronics engineering at Don Bosco Technical College.