Lectures
14, Jul 21'
Webinars
In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows to study the mechanical properties like ...
23, Jun 21'
Webinars
Interactive session will consist of demonstrating nanoindentation process (Set point & Z height). Differences in the result analysis will be explained. Demonstration ...
23, Jun 21'
Webinars
In this course, we will show details and advantages of the KPFM technique, together with a demonstration of its ease of use.
Kelvin Probe Force M...
28, May 21'
Webinars
前回のAFM基礎コースPart２に引き続き、イメージングに必須のプローブについてお話します。
パーク・システムズの使い易いオペレーションソフトウエアと適切なプローブの選択で、正確で情報量の多いデータを取得していただければと思います。
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2, Jun 21'
Webinars
In this webinar we will demonstrate the use of these automation features.
Make the most out of your time: the benefits of easy automat...
25, May 21'
Webinars
Lecture topics will be reinforced through demonstration and practice of PinPoint nanomechanical imaging on a Park Systems NX series AFM. Emphasis will be put in the diffe...
25, May 21'
Webinars
The target of this session is to help understand the interactions between tip and sample based on fundamental knowledge on principles of AFM. After all, some images which...
20, May 21'
Webinars
Sideband Kelvin Probe Force Microscopy (KPFM) uses the intermodulation of an electrostatic drive force and a mechanical drive force to upconvert the electrostatic frequen...
12, May 21'
Webinars
Kelvin Probe Force Microscopy to Study Energy Levels and Charge Transport in Semiconductor Thin Films
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23, Apr 21'
Webinars
桜もそろそろ終わりですが、新年度のスタートということでAFM基礎part２をお届けいたします。
前回と重複する部分もありますが、その続きとして切り口を少し変えて、３種類の基本の形状測定がどのようなアプリケーション測定のベースになっているのか、
ということをそれぞれの測定モードの特徴を踏まえながらお話させていただきます。
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