New hybrid metrology solutions using advances in automated Atomic Force Microscopy,
SEMICON EUROPA 2021, Munich, Germany
Date: Tuesday, November 16 – Friday, November 19, 2021
Time: 12:00 pm
Place: Neue Messe München, Munich, Germany
Enjoy the lunch snacks and the seminar on: “New hybrid metrology solutions using advances in automated Atomic Force Microscopy,” presented by Haneol Cho, industrial application scientist at Park Systems Europe, every Semicon day at 12:00 pm.
In the 30-minutes presentation, we will be revealing new hybrid nanotechnology techniques that provide a holistic pool of information meeting an even broader range of needs and requirements of semiconductor business like imaging narrow or deep trenches, sidewalls, undercuts, layer thicknesses, defect review, hot spot detection, or imaging material properties locally, and more!
The LUNCHEON is open to everyone and is FREE of charge.