イベント

PinPoint™ is an advance imaging mode developed by Park Systems, that acquires high-resolution topography and F/D data at each pixel of the entire scan area. With PinPoint™ mode, quantitative nanomechanical properties (i.e., modulus, adhesion, topography) can be obtained all at once. This session will demonstrate how to acquire nanomechanical properties using Park Systems PinPoint™ Mode. Park NX10 hardware and software will be used to explain basic principle, calibration and data analysis.