イベント

Atomic Force Microscopy (AFM) uses a feedback loop to obtain nanoscale resolution images. This feedback is reliant on keeping a parameter constant. In contact-based imaging this is a constant force and in True Non-Contact™ imaging, an amplitude of a resonance at a given frequency. In Scanning Ion Conductance Microscopy (SICM), the cantilever is replaced with a pipette, filled with ionic fluid and the flow of ions kept constant, which generates a measurable current, allowing another imaging technique using similar principles to AFM. This session will demonstrate this technique and focus on Approach Retract Scanning (ARS) to image with a pipette using Park Systems AFM.