网络讲座: 导电原子力显微镜原位观测电子突触的纳米级动态响应
SPEAKERS
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Dr. Fei Hui
Technion-Israel Institute of Technology, Israel
- Fei Hui, Postdoctoral fellow at Technion-Israel Institute of Technology, Dr. Hui got her PhD degree in Nanoscience in 2018 at the University of Barcelona. During her PhD, she studied at Massachusetts Institute of Technology (MIT, USA) for 12 months and the University of Cambridge (UK) for 6 months. She has published over 38 research papers, 11 of them are as first author, including Nature Electronics, Advanced Functional Materials, ACS Applied Materials and Interfaces, 2D materials, Nanoscale. Moreover, Dr. Hui edited one book chapter on CAFM for Wiley-VCH, and applied for two international patents. She has been awarded 2019 Park AFM Scholarship, Mobility Grant of Royal Society of Chemistry. Her research interests focus on chemical vapor deposition of high-quality two-dimensional materials and the application in nanoelectronics
- Access Speaker Publications
SPEAKERS
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- Dr. Fei Hui
- Technion-Israel Institute of Technology, Israel
Authors
讲座摘要：
AFM原位探测纳米尺度突触响应
神经形态和类脑计算具有并行处理和存储大量数据的能力且功耗低等优点，正在引起学术界和工业界的巨大关注。三端晶体管或两端忆阻器等电子器件常被用来模拟神经突触的可塑性等行为，而目前大多数报道的电学仿生突触尺寸较大（>1 um2），难以满足工业要求的高集成密度（1010 器件/mm2）。
在本次讲座中将介绍如何利用导电原子力显微镜（CAFM）结合半导体参数分析仪（SPA）在纳米尺寸（~50 nm2）原位观测忆阻型电子突触的动态响应，以及多种可塑性行为的模拟，包括低功耗双脉冲易化、兴奋性突触后电流、长时程增强/抑制等。本工作为研究纳米尺寸突触行为的探索提供了一种新的研究方法。
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