Conductive atomic force microscopy used for two-dimensional materials and nanoelectronics - October 31, 2019 (Chinese/中文)
SPEAKERS
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Dr. Fei Hui
Technion-Israel Institute of Technology, Israel
- Fei Hui, Postdoctoral fellow at Technion-Israel Institute of Technology, Dr. Hui got her PhD degree in Nanoscience in 2018 at the University of Barcelona. During her PhD, she studied at Massachusetts Institute of Technology (MIT, USA) for 12 months and the University of Cambridge (UK) for 6 months. She has published over 38 research papers, 11 of them are as first author, including Nature Electronics, Advanced Functional Materials, ACS Applied Materials and Interfaces, 2D materials, Nanoscale. Moreover, Dr. Hui edited one book chapter on CAFM for Wiley-VCH, and applied for two international patents. She has been awarded 2019 Park AFM Scholarship, Mobility Grant of Royal Society of Chemistry. Her research interests focus on chemical vapor deposition of high-quality two-dimensional materials and the application in nanoelectronics
- Access Speaker Publications
SPEAKERS
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- Dr. Fei Hui
- Technion-Israel Institute of Technology, Israel
Authors
Conductive atomic force microscopy (CAFM) is one of the most powerful scanning probe microscopy (SPM) techniques, it can not only characterize the topography of specimen, but also analyze the local electronic properties of many dielectric materials and electronic devices.
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