网络讲座：导电原子力显微镜（C-AFM）在二维材料及纳米电子器件中的应用
SPEAKERS
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Dr. Fei Hui
Technion-Israel Institute of Technology, Israel
- Fei Hui, Postdoctoral fellow at Technion-Israel Institute of Technology, Dr. Hui got her PhD degree in Nanoscience in 2018 at the University of Barcelona. During her PhD, she studied at Massachusetts Institute of Technology (MIT, USA) for 12 months and the University of Cambridge (UK) for 6 months. She has published over 38 research papers, 11 of them are as first author, including Nature Electronics, Advanced Functional Materials, ACS Applied Materials and Interfaces, 2D materials, Nanoscale. Moreover, Dr. Hui edited one book chapter on CAFM for Wiley-VCH, and applied for two international patents. She has been awarded 2019 Park AFM Scholarship, Mobility Grant of Royal Society of Chemistry. Her research interests focus on chemical vapor deposition of high-quality two-dimensional materials and the application in nanoelectronics
- Access Speaker Publications
SPEAKERS
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- Dr. Fei Hui
- Technion-Israel Institute of Technology, Israel
Authors
导电原子力显微镜（C-AFM）是一种非常有用的扫描探针显微镜（SPA）纳米表征技术，它不仅可以对样品的形貌进行表征，更重要的是可以探测许多介质材料和电子器件的局部电学性质。C-AFM技术已经成功表征了介质薄膜的许多重要的纳米级现象，比如：局部缺陷、电荷捕获和释放、应力诱导漏电流、负偏置温度不稳定性等。
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