A Comparative Study for Surface Potential Mapping Using KPFM
Speaker : Charles Kim Affiliation : Park Systems Korea Region : China Year : 2020 Language : English Explore the applications of Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KPFM) for surface potential mapping. Understand their significance in semiconductor and polymer research, uncovering insights into surface properties critical for various industries.
